CAPACITANCE VARIATIONS IN Cd3As2 THIN FILM SANDWICH STRUCTURES
R.D. Gould and M. Din
Thin Films Laboratory, Department of Physics, School of Chemistry and Physics, Keele University, Keele, Staffs. ST5 5BG, U.K.
Cadmium arsenide (Cd3As2)is a high conductivity II-V semiconductor. Following a recent de investigation [1], capacitance has been measured as a function of film thickness, temperature (163-453 K), and frequency (100 Hz-20 kHz) in Ag-Cd3As2-Al structures. There was a decrease with frequency and an increase with temperature, as reported in various other materials. After annealing at 473 K the decrease in capacitance with frequency was enhanced due to concomitant changes in the equivalent circuit parameters, whereas unannealed Ag-Cd3As2-(Au or Ag) structures showed reduced capacitance, ascribed to changes in the contact impedance.
[1] M. Din and R.D. Gould, Thin Solid Films, 340, 28-32 (1999).