CORRELATION BETWEEN FILM MICROSTRUCTURE
AND OPTICAL ABSORPTION IN Te THIN FILMS

Faculty of Physics, "Al.I.Cuza" University, Iassy R-6600, Romania

The absorption spectra in the region of the fundamental absorption edge (2–5m m) for vacuum evaporated Te thin films (d=0.080-1.200m ) deposited onto glass substrates have been investigated. It was established that the absorption coefficient a and the location of the fundamental absorption edge depend on the film thickness and deposition conditions. X-ray diffraction measurements revealed that in the thinner films (0.100-0.250m m) the crystallites grow with their c-axes parallel to the substrate but with the increase of film thickness, the crystallites begin to grow obliquely on the substrate. This modification of crystallite orientation with film thickness and also the dichroism in the infrared of tellurium single crystal are take into account for explanation of obtained results.